By John Wolstenholme
This e-book discusses using Auger electron spectroscopy (AES) and scanning Auger microscopy for the characterization of quite a lot of technological fabrics, together with, metals and alloys, semiconductors, nanostructures, and insulators. Its price as a device for high-resolution elemental imaging and compositional intensity profiling is illustrated and the application of the approach for acquiring compositional info from the surfaces, interfaces, and skinny movie buildings of technological and engineering fabrics is verified. This quantity additionally describes the elemental actual rules of AES in uncomplicated, mostly qualitative phrases. significant elements of commonplace Auger spectrometers also are defined. The e-book discusses different varieties of research for which an Auger electron spectrometer can be utilized, for instance, secondary electron microscopy, backscattered electron imaging, X-ray spectroscopy, in addition to the connection among AES and different research thoughts.